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Ion implantation: nanoporous germanium
Stepanov A.L., Nuzhdin V.I., Valeev V.F., Rogov А.М., Konovalov D.А.
Sputtering Yields for Single Crystal Samples of PbX (X = S, Se, Te) with Different Crystallographic Orientations
Zimin S.P., Amirov I.I., Mazaletsky L.A., Kolesnikov N.N., Timonina A.V.
Self-Forming Silicon Nitride Nanomask and Its Applications
Smirnov V.K., Kibalov D.S., Lepshin P.A., Zhuravlev I.V., Smirnova G.F.
The effect of atmospheric oxide thermodesorption on negative-ion atomic and cluster sputtering of silicon single crystal by cesium ions
Atabaev B.G., Djabbarganov R., Khalmatov A.S., Rakhmatov A.Z., Kamardin A.I.
Study of silicon dioxide sputtering by a focused gallium ion beam
Podorozhniy О.V., Rumyantsev А.V., Volkov R.L., Borgardt N.I.
Study of the Influence of Ion-Beam Etching on the Surface Roughness of Single-Crystal Sapphire
Mikhailenko M.S., Pestov A.E., Zorina M.V., Chernyshev A.K., Chkhalo N.I., Shevchuk I.E.
Formation of Nanostructures on the Surface of Aluminium—Silicon Films by Bombardment with Low-Energy Argon Ions of Inductive RF Discharge Plasma
Bachurin V.I., Amirov I.I., Lobzov K.N., Simakin S.G., Smirnova M.A.
Influence of Low-Energy Ion Bombardment on the Texture and Microstructure of Pt Films
Selyukov R.V., Naumov V.V., Izyumov M.O., Vasilev S.V., Mazaletskiy L.A.
Radiation-stimulated processes under interaction of ions with porous structures
Nikiforova N.N., Oksengendler B.L., Ashurov K.B., Kutlimurotov B.R., Maksimov S.Е., Galkina О.А.
Modification and Sputtering of Inhomogeneous Multilayer Oxidized Metal Films by Low-Current Argon Ion Beams
Lukiantsev D.S., Lubenchenko A.V., Ivanov D.A., Pavolotsky A.B., Lubenchenko O.I., Ivanova I.V., Pavlov O.N.
Features of cluster ion treatment of the surface of KGd(WO4)2:Nd single crystal
Nikolaev I.V., Korobeishchikov N.G.
Effect of deformation nanostructuring on ion-beam erosion of copper
Andrianova N.N., Borisov A.M., Ovchinnikov M.A., Khisamov R.K., Mulyukov R.R.
Wave-like periodic structures on the silicon surface initiated by irradiation with a focused gallium ion beam
Bachurin V.I., Smirnova M.A., Lobzov K.N., Lebedev M.E., Mazaletsky L.A., Pukhov D.E., Churilov A.B.
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