作者的详细信息
Астафьев, С. Б.
| 期 | 栏目 | 标题 | 文件 |
| 卷 69, 编号 3 (2024) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | Determination of the structure of weakly ordered films according to x-ray diffraction data | |
| 卷 68, 编号 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | FEATURES OF THE APPLICATION OF MATHEMATICAL OPTIMIZATION METHODS FOR THE STUDY OF NANOSTRUCTURES BASED ON X-RAY DIFFRACTION DATA |