Computer diffraction tomography: a comparative analysis of the use of controlled and wavelet filters for image processing

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Abstract

The paper provides digital processing of 2D X-ray projection images of a Coulomb-type point defect in a Si(111) crystal recorded by a detector against the background of statistical Gaussian noise. A managed filter and a wavelet filter with a 4th-order Daubechies function are used. The efficiency of filtering 2D images is determined by calculating the relative quadratic deviations of the intensities of filtered and reference (noiseless) 2D images averaged over all points. A comparison of the calculated values of the relative deviations of the intensities shows that the considered methods work quite well and both, in principle, can be effectively used in practice for noise processing of X-ray diffraction images used for 3D reconstruction of nanoscale defects of crystal structures.

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About the authors

V. I. Bondarenko

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”

Author for correspondence.
Email: bondarenko.v@crys.ras.ru
Russian Federation, 119333 Moscow

S. S. Rekhviashvili

Institute of Applied Mathematics and Automation KBSC RAS

Email: bondarenko.v@crys.ras.ru
Russian Federation, 360000 Nalchik

F. N. Chukhovskii

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC “Kurchatov Institute”; Institute of Applied Mathematics and Automation KBSC RAS

Email: bondarenko.v@crys.ras.ru
Russian Federation, 119333 Moscow; 360000 Nalchik

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