Changes in the optical properties of coatings based on hollow ZnO/SiO2 particles under electron irradiation
- Авторлар: Dudin A.N.1, Yurina V.Y.1, Neshchimenko V.V.1, Mikhailov M.M.1,2, Yuriev S.A.1,2, Lapin A.N.2
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Мекемелер:
- Аmur State University
- Tomsk State University of Control Systems and Radioelectronics
- Шығарылым: № 4 (2024)
- Беттер: 51-56
- Бөлім: Articles
- URL: https://ter-arkhiv.ru/1028-0960/article/view/664656
- DOI: https://doi.org/10.31857/S1028096024040068
- EDN: https://elibrary.ru/GJKVHD
- ID: 664656
Дәйексөз келтіру
Аннотация
A comparative analysis of the diffuse reflectance spectra and their changes after irradiation with electrons with an energy of 30 keV of coatings based on polymethylphenylsiloxane resin and pigment powders of two-layer hollow ZnO/SiO2 particles was carried out. The analysis was carried out in situ in the range 250–2500 nm. The samples were irradiated in a “Spectrum” space simulator. The radiation resistance of the studied coatings based on two-layer hollow ZnO/SiO2 particles was estimated relative to coatings based on ZnO polycrystals by analyzing the difference diffuse reflectance spectra obtained by subtracting the spectra after irradiation from the spectra of unirradiated samples. It has been found that the intensity of the induced absorption bands in coatings based on hollow ZnO/SiO2 particles is less than in coatings based on ZnO microparticles, and the radiation resistance when estimating changes in the integral absorption coefficient of solar radiation (ΔαS) is twice as high. The increase in radiation resistance is probably determined by the different nature of defect accumulation: in the case of solid microparticles, defects can accumulate inside grains; in hollow particles, the accumulation of defects can occur only within the thin shell of the sphere.
Толық мәтін

Авторлар туралы
A. Dudin
Аmur State University
Email: viktoriay-09@mail.ru
Ресей, 675027, Blagoveshchensk
V. Yurina
Аmur State University
Хат алмасуға жауапты Автор.
Email: viktoriay-09@mail.ru
Ресей, 675027, Blagoveshchensk
V. Neshchimenko
Аmur State University
Email: viktoriay-09@mail.ru
Ресей, 675027, Blagoveshchensk
M. Mikhailov
Аmur State University; Tomsk State University of Control Systems and Radioelectronics
Email: viktoriay-09@mail.ru
Ресей, 675027, Blagoveshchensk; 634050, Tomsk
S. Yuriev
Аmur State University; Tomsk State University of Control Systems and Radioelectronics
Email: viktoriay-09@mail.ru
Ресей, 675027, Blagoveshchensk; 634050, Tomsk
A. Lapin
Tomsk State University of Control Systems and Radioelectronics
Email: viktoriay-09@mail.ru
Ресей, 634050, Tomsk
Әдебиет тізімі
- Wang Y., Sunkara B., Zhan J., He J., Miao L., McPherson G.L., John V.T., Spinu L. // Langmuir. 2012. V. 28. P. 13783. https://www.doi.org/10.1021/la302841c
- Yan Y., Li A., Lu C., Zhai T., Lu S., Li W., Zhou W. // Chem. Engin. J. 2020. V. 396. P. 125316. https://www.doi.org/10.1016/j.cej.2020.125316
- Li C., Liang Z., Xiao H., Wu Y., Liu Y. // Mater. Lett. 2010. V. 64. № 18. P. 1972. https://www.doi.org/0.1016/j.matlet.2010.06.027
- Rasmidi R., Duinong M., Chee F.P. // Radiat. Phys. Chem. 2021. V. 184. P. 109455. https://www.doi.org/10.1016/j.radphyschem.2021.109455
- Li C., Mikhailov M.M., Neshchimenko V.V. // Nucl. Instrum. Methods Phys. Res. B. 2014. V. 319. P. 123. https://www.doi.org/10.1016/j.nimb.2013.11.007
- Belov A., Mikhaylov A., Korolev D., Guseinov D., Gryaznov E., Okulich E., Sergeev V., Antonov I., Kasatkin A., Gorshkov O., Tetelbaum D., Kozlovski V. // Nucl. Instrum. Methods Phys. Res. B. 2016. V. 379. P. 13. https://www.doi.org/10.1016/j.nimb.2016.02.054
- Bhatia S., Verma N. // Mater. Res. Bull. 2017. V. 95. P. 468. https://www.doi.org/10.1016/j.materresbull.2017.08.019
- Singh V.P., Das D., Rath C. // Mater. Res.h Bull. 2013. V. 48. № 2. P. 682. https://www.doi.org/10.1016/j.materresbull.2012.11.026
- Wang Z.G., Zu X.T., Zhu S., Wang L.M. // Physica E. 2006. V. 35. № 1. P. 199. https://www.doi.org/10.1016/j.physe.2006.07.022
- Spallino L., Spera M., Vaccaro L., Agnello S., Gelar- di F.M., Zatsepin A.F., Cannas M. // Appl. Surf. Sci. 2017. V. 420. P. 94. https://www.doi.org/10.1016/j.apsusc.2017.05.082
- Amosov A.V., Dzyuba V.P., Kulchin Yu.N., Storozhen- ko D.V. // Phys. Procedia. 2017. V. 86. P. 61. https://www.doi.org/10.1016/j.phpro.2017.01.021
- Singh S.K., Kumar A., Singh S., Kumar A., Jain A. // Silicon. 2021. V. 38. № 5. P. 2861. https://www.doi.org/10.1016/j.matpr.2020.09.137
- Chen J., Yu Y., Xiu H., Feng A., Mi L., Yu Y.// Ceram. Int. 2022. V. 48. № 19. P. 28006. https://www.doi.org/10.1016/j.ceramint.2021.09.155
- Neshchimenko V.V., Li C., Mikhailov M.M. // Dyes and Pigments. 2017. V. 145. P. 354. https://www.doi.org/10.1016/j.dyepig.2017.03.058
- Neshchimenko V.V., Li C., Mikhailov M.M., Lv J. // Nanoscale. 2018. V. 10. № 47. P. 22335. https://www.doi.org/10.1039/C8NR04455D
- Mikhailov M.M., Yuryev S.A., Lapin A.N., Goronch- ko V.A. // Ceram. Int. 2023. V. 49. № 12. P. 20817. https://www.doi.org/10.1016/j.ceramint.2023.03.214
- Дудин А.Н., Нещименко В.В., Ли Ч. // Поверхность. Рентген., синхротр. и нейтрон. исслед. 2022. № 4. С. 70. https://www.doi.org/10.31857/S1028096022040069
- Kositsyn L.G., Mikhailov M.M., Kuznetsov N.Y., Dvoretskii M.I. // Instrum. Exp. Tech. 1985. V. 28. P. 929.
- Johnson F.S. // J. Meteorological. 1954. V. 11. № 6. P. 431.
- ASTM E490-00a Standard Solar Constant and Zero Air Mass Solar Spectral Irradiance Tables. 2019.
- ASTM E903-96 Standard Test Method for Solar Absorptance, Reflectance, and Transmittance of Materials Using Integrating Spheres. 2005.
- Agostinelli S., Allison J., Amako K., Apostolakis J., Araujo H., Arce P., Asai M., Axen D., Banerjee S., Barrand G., Behner F., Bellagamba L., Boudreau J., Broglia L., Brunengo A., Burkhardt H., Chauvie S., Chuma J., Chytracek R., Cooperman G. // Nucl. Instrum. Methods Phys. Res. A. 2003. V. 506. P. 250. https://www.doi.org/10.1016/S0168-9002(03)01368-8
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