Investigation of Intercalation and De-Intercalation of Lithium Ions in Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry

Cover Page

Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

This paper presents an in-situ study of lithium distribution in an all-solid-state thin-film lithium-ion battery by Rutherford Backscattering Spectrometry (RBS). Helium ions (4He+) with energy 1.8 MeV were used in the experiment under conditions of normal falling to the surface. The angle of ion scattering was 165°. Based on the energy loss of scattered ions, the lithium concentration in the battery layers was obtained in both the charge and discharge state. It was found that the lithium concentrations obtained using RBS and the galvanostatic method coincide numerically, provided that the 4He+ stopping cross section for lithium in anode layer were two times smaller than for single element.

Full Text

Restricted Access

About the authors

S. V. Kurbatov

RUDN University

Author for correspondence.
Email: kurbatov-93@bk.ru
Moscow, 117198

N. S. Melesov

Yaroslavl Branch of the Valiev Institute of Physics and Technology of the RAS

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150067

E. O. Parshin

Yaroslavl Branch of the Valiev Institute of Physics and Technology of the RAS

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150067

A. S. Rudy

Yaroslavl Branch of the Valiev Institute of Physics and Technology of the RAS

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150067

A. A. Mironenko

Demidov Yaroslavl State University

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150003

V. V. Naumov

Demidov Yaroslavl State University

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150003

A. M. Skundin

A.N. Frumkin Institute of Physical Chemistry and Electrochemistry of the RAS

Email: melesovns@mail.ru
Russian Federation, Moscow, 119071

V. I. Bachurin

Yaroslavl Branch of the Valiev Institute of Physics and Technology of the RAS

Email: melesovns@mail.ru
Russian Federation, Yaroslavl, 150067

References

  1. Cras F.L., Pecquenard B., Dubois V., Phan V.P., Guy‐Bouyssou D. // Adv. Energy Mater. 2015. V. five. №19. P. 1501061. https://doi.org/10.1002/aenm.201501061
  2. Iida S.I., Terashima M., Mamiya K., Chang H.Y., Sasaki S., Ono A., Kimoto T., Miyayama T. // Journal of Vacuum Science & Technology B. 2021. V. 39. № 4. https://doi.org/10.1116/6.0001044
  3. Jeong E., Hong C., Tak Y., Nam S.C., Cho S. // Journal of power sources. 2006. V. 159. №1. P. 223. https://doi.org/10.1016/j.jpowsour.2006.04.042
  4. Uhart A., Ledeuil J.B., Pecquenard B., Le Cras F., Proust M., Martinez H. // ACS applied materials & interfaces. 2017. V. 9. № 38. P. 33238. https://doi.org/10.1021/acsami.7b07270
  5. Masuda H., Ishida N., Ogata Y., Ito D., Fujita D. // Journal of Power Sources. 2018. V. 400. P. 527. https://doi.org/10.1016/j.jpowsour.2018.08.040
  6. Yamamoto K., Iriyama Y., Asaka T., Hirayama T., Fujita H., Nonaka K., Miyahara K., Sugita Y., Ogumi Z. // Electrochemistry communications. 2012. V. 20. P. 113.
  7. Oukassi S., Bazin A., Secouard C., Chevalier I., Poncet S., Poulet S., Boissel J-M., Geffraye F., Brun J., Salot R. // 2019 IEEE IEDM. 2019. P. 26.1.1–26.1.4. https://doi.org/10.1109/IEDM19573.2019.8993483
  8. Wang Z., Santhanagopalan D., Zhang W., Wang F., Xin H.L. He, K., Li J., Dudney N.J., Meng Y.S. // Nano letters. 2016. V. 16. № 6. P. 3760–3767. https://doi.org/10.1021/acs.nanolett.6b01119
  9. Matsuda Y., Kuwata N., Okawa T., Dorai A., Kamishima O., Kawamura J. // Solid State Ionics. 2019. V. 335. P. 7–14. https://doi.org/10.1016/j.ssi.2019.02.010
  10. Inaba M., Iriyama Y., Ogumi Z., Todzuka Y., Tasaka A. // Journal of Raman spectroscopy. 1997. V. 28. № 8. P. 613–617. https://doi.org/10.1002/(SICI)1097–4555(199708)28:8<613::AID-JRS138>3.0.CO;2-T
  11. Chen C., Jiang M., Zhou T., Raijmakers L., Vezhlev E., Wu B., Schülli T.U., Danilov D.L., Wei Y., Eichel R-A., Notten P.H. // Adv. Energy Mater. 2021. V. 11. № 13. P. 2003939. https://doi.org/10.1002/aenm.202003939
  12. Tsuchiya B., Morita K., Nagata S., Kato T., Iriyama Y., Tsuchida H., Majima T. // Surface and Interface Analysis. 2014. V. 46. № 12–13. P. 1187–1191. https://doi.org/10.1002/sia.5620
  13. Oudenhoven J.F. M., Labohm F., Mulder M., Niessen R.A. H., Mulder F.M., Notten P. // Advanced Materials. 2011. V. 35. № 23. P. 4103–4106. https://doi.org/10.1002/adma.201101819
  14. Mathayan V., Morita K., Tsuchiya B., Ye R., Baba M., Primetzhofer D. // Materials Today Energy. 2021. V. 21. P. 100844. https://doi.org/10.1016/j.mtener.2021.100844
  15. Wang B., Bates J.B., Hart F.X., Sales B.C., Zuhr R.A., Robertson J.D. // J. Electrochem. Soc. 1996. V. 143. № 10. P. 3203. https://doi.org/10.1149/1.1837188
  16. Lee S.J., Baik H.K., Lee S.M. // Electrochemistry Communications. 2003. V. 5. № 1. P. 32–35. https://doi.org/10.1016/S1388–2481(02)00528–3
  17. Fujibayashi T., Kubota Y., Iwabuchi K., Yoshii N. // AIP Advances. 2017. V. 7. № 8. https://doi.org/10.1063/1.4999915
  18. Рудый А.С., Мироненко А.А., Наумов В.В., Федоров И.С., Скундин А.М., Торцева Ю.С. // Микроэлектроника. 2021. Т. 50. № 5. С. 370–375. https://doi.org/10.31857/S0544126921050057
  19. Mayer M. SIMNRA User’s Guide. Germany: Max-Planck Institut fur Plasmaphysik, 2011. 220 p
  20. Альвиев Х.Х. // Электрохимическая энергетика. 2013. Т. 13. № 4. С. 225–227.
  21. Востриков В.Г., Каменских А.И., Ткаченко Н.В. // Поверхность. Рентген., синхротр. и нейтрон. исслед. 2020. № 1. С. 28–35. https://doi.org/10.31857/S1028096020010203
  22. Беспалова О.В., Борисов A.M., Востриков В.Г., Куликаускас В.С., Малюков Е.Е., Моломин В.И., Потапенко Е.М., Романовский Е.А., Серков М.В. // Известия РАН. Серия физическая. 2008. Т. 72. № 7. С. 1028–1030.
  23. Борисов А.М., Виргильев Ю.С., Дьячковский А.П., Машкова Е.С., Немов A.С., Сорокин А.И. // Поверхность. Рентген., синхротр. и нейтрон. исслед. 2006. № 4. С. 9–13.
  24. Кикоин И.К. Таблицы физических величин. Справочник. М.: Атомиздат, 1976. 1008 с.
  25. Kurbatov S.V., Rudy A.S., Naumov V.V., Mironenko A.A., O.V. Savenko O.V., Smirnova M.A., Mazaletskiy L.A., Pukhov D.E. // Russian Microelectronics. 2024. V. 53. № 3. P. 202–216. DOI: https://doi.org/10.1134/S1063739724600250
  26. Chu W.K. Backscattering spectrometry. Academic Press, 1978. 384 p.
  27. Ziegler J.F., Manoyan J.M. The stopping of ions in compounds // Nuclear Inst. and Methods in Physics Research. B. 1988. V. 35. № 3–4. P. 215–228. https://doi.org/10.1016/0168–583X(88)90273-X

Supplementary files

Supplementary Files
Action
1. JATS XML
Download
2. Fig. 1. (a) - Photograph of the TTLIA sample with layer designations, (b) - sample on the ROP analyser stage: 1 - lower titanium current collector, 2 - LiPON/LiCoO2 layer boundary, 3 - open part of the Si@O@Al layer, 4 - upper titanium current collector.

Download (295KB)
Indexing metadata
3. Fig. 2. Schematic of scattering of a normally incident He+ beam on a TTLIA.

Download (78KB)
Indexing metadata
4. Fig. 3. Charge-discharge curves of TTLIA with Ti/Si@O@Al(anode)LiPON(electrolyte)/LiCoO2(cathode)/Ti structure: (a) - current 8 μA, potential window 1.5-3.8 V, (b) - current 4 μA, potential window 1.5-3.8 V. (1 - battery charge, 2 - discharge).

Download (200KB)
Indexing metadata
5. Fig. 4. SEM image of the transverse spalling of the TTLIA.

Download (387KB)
Indexing metadata
6. Fig. 5. Reserford backscattering spectra of TTLIA in charged (curve 1 in the figure) and discharged (curve 2 in the figure) states; (a) - charge-discharge current of 8 μA, (b) - current of 4 μA. The initial energy of probing He+ ions is 1.8 MeV, irradiation dose D = 10 μCl, channel width is 2.2376 keV.

Download (382KB)
Indexing metadata
7. Fig. 6. Comparison of experimental spectra (curve - 1) with the results of SIMNRA modelling (Fig. 2): (a) - in discharged state, current 8 μA, (b) - in charged state, current 8 μA, (c) - in discharged state, current 4 μA and (d) - in charged state, current 4 μA. The channel width is 2.2376 keV and the zero offset is 26 keV.

Download (504KB)
Indexing metadata

Copyright (c) 2024 Russian Academy of Sciences