THE STUDY OF GROWTH DEFECTS IN CUBIC SINGLE CRYSTALS OF SYNTHETIC DIAMOND USING X-RAY TOPO-TOMOGRAPHY

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The spatial distribution of linear defects in cuboctahedral single crystals of synthetic diamonds, grown under laboratory conditions by the high-pressure high-temperature (HPHT) method near the diamond–graphite equilibrium line, has been studied. Synthetic diamonds of this type have been studied for the first time by the X-ray topo-tomography using a laboratory X-ray source.

作者简介

N. Anisimov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia; Moscow State University, Moscow, 119234 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва; Россия, Москва

D. Zolotov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

A. Buzmakov

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

I. Dyachkova

Shubnikov Institute of Crystallography, Federal Research Center “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: anisimov.np17@physics.msu.ru
Россия, Москва

V. Asadchikov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

编辑信件的主要联系方式.
Email: asad@crys.ras.ru
Россия, Москва

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