A New Method for Determining the Size of a Synchrotron Radiation Beam in the Focus of a Compound Refractive Lens

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Дәйексөз келтіру

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Рұқсат жабық Тек жазылушылар үшін

Аннотация

A new method is proposed for determining experimentally the size of a synchrotron radiation beam in the focus of planar compound refractive lenses. The method consists in measuring the angular divergence of radiation after the focus using Bragg diffraction in a perfect crystal during its rotation. This method determines the beam size, which depends only on the focusing properties of the lenses in use, in contrast to other currently applied methods. The efficiency of the proposed approach has been experimentally demonstrated using nanofocusing planar silicon lenses as an example.

Негізгі сөздер

Авторлар туралы

M. Folomeshkin

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

V. Kohn

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

A. Seregin

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

Yu. Volkovsky

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

P. Prosekov

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

V. Yunkin

Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, 142432, Chernogolovka, Moscow oblast, Russia

Email: folmaxim@gmail.com
Россия, Черноголовка

D. Zverev

Immanuel Kant Baltic Federal University, 236016, Kaliningrad, Russia

Email: folmaxim@gmail.com
Россия, Калининград

A. Barannikov

Immanuel Kant Baltic Federal University, 236016, Kaliningrad, Russia

Email: folmaxim@gmail.com
Россия, Калининград

A. Snigirev

Immanuel Kant Baltic Federal University, 236016, Kaliningrad, Russia

Email: folmaxim@gmail.com
Россия, Калининград

Yu. Pisarevsky

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

A. Blagov

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia

Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва

M. Kovalchuk

National Research Centre “Kurchatov Institute”, 123182, Moscow, Russia; Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, 119333, Moscow, Russia; St. Petersburg State University, 199034, St.Petersburg, Russia

Хат алмасуға жауапты Автор.
Email: folmaxim@gmail.com
Россия, Москва; Россия, Москва; Россия, Санкт-Петербург

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