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Vol 68, No 2 (2023)
COMPARATIVE X-RAY DIFFRACTOMETRY OF THE DEFECT STRUCTURE OF ZnO EPITAXIAL FILMS DEPOSITED BY MAGNETRON SPUTTERING ON C-PLANE Al2O3 SUBSTRATES IN INHOMOGENEOUS ELECTRIC FIELD
Volkovsky Y.A., Zhernova V.A., Folomeshkin M.S., Prosekov P.A., Muslimov A.E., Butashin A.V., Ismailov A.M., Grigoriev Y.V., Pisarevsky Y.V., Kanevsky V.M.
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(Rus)
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