X-RAY REFLECTOMETRY OF THIN FILMS FORMED DURING PHASE SEPARATION OF ORGANIC SOLUTIONS OF ALIPHATIC POLYETHERS IN WATER

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

The possibilities of X-ray reflectometry for studying the structure of planar liquid-phase membranes are demonstrated by the example of polyester films formed on the surface of deionized water from solutions of polylactoglycolide (PLG) in chloroform and tetraglycol (TG). It is found that the use of solutions with PLG concentrations ranging from 1 to 4 wt % or above 6 wt % leads to a proportional increase in the density of these films with preservation of their structure and thickness up to 25 Å. At a PLG concentration close to 5 wt % the PLG/TG system transits to an unstable state, characterized by intense penetration of PLG aliphatic chains into the water substrate bulk to a depth up to 100 Å.

Негізгі сөздер

Авторлар туралы

V. Asadchikov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

Yu. Volkov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

B. Roshchin

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

A. Nuzhdin

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

E. Chernavskay

National Research Nuclear University MEPhI (Moscow Engineering Physics Institute), Moscow, 115409 Russia

Email: asad@crys.ras.ru
Россия, Москва

A. Tikhonov

Kapitza Institute for Physical Problems, Russian Academy of Sciences, Moscow, 119334 Russia

Email: asad@crys.ras.ru
Россия, Москва

A. Mironov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

A. Mariyanac

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Email: asad@crys.ras.ru
Россия, Москва

V. Popov

Shubnikov Institute of Crystallography, Federal Scientific Research Centre “Crystallography and Photonics,” Russian Academy of Sciences, Moscow, 119333 Russia

Хат алмасуға жауапты Автор.
Email: asad@crys.ras.ru
Россия, Москва

Әдебиет тізімі

  1. Martina M., Hutmacher D.W. // Polymer Int. 2007. V. 56. № 2. P. 145. https://doi.org/10.1002/pi.2108
  2. Sensini A., Gualandi C., Focarete M.L. et al. // Biofabrication. 2019. V. 11. № 3. P. 035026.
  3. Karageorgiou V., Kaplan D. // Biomaterials. 2005. V. 26. № 27. P. 5474. https://doi.org/10.1016/j.biomaterials.2005.02.002
  4. Pryadko A., Surmeneva M., Surmenev R. // Polymers. 2021. V. 13. № 11. P. 1738. https://doi.org/10.3390/polym13111738
  5. Chen G.Q., Wu Q. // Biomaterials. 2005. V. 26. № 33. P. 6565. https://doi.org/10.1016/j.biomaterials.2005.04.036
  6. Eltom A., Zhong G., Muhammad A. // Adv. Mater. Sci. Eng. 2019. V. 2019. P. 3429527. https://doi.org/10.1155/2019/3429527
  7. Yin H.M., Qian J., Zhang J. et al. // Polymers. 2016. V. 8. № 6. P. 213. https://doi.org/10.3390/polym8060213
  8. Adamkiewicz M., Rubinsky B. // Cryobiology. 2015. V. 71. № 3. P. 518. https://doi.org/10.1016/j.cryobiol.2015.10.152
  9. Kamali A., Shamloo A. // J. Biomechanics. 2019. V. 98. P. 109466. https://doi.org/10.1016/j.jbiomech.2019.109466
  10. Mou Z.L., Zhao L.J., Zhang Q.A. et al. // J. Supercrit. Fluids. 2011. V. 58. P. 398. https://doi.org/10.1016/j.supflu.2011.07.003
  11. Sun H., Zhao Q., Zheng L.W. et al. // Nano LIFE. 2021. V. 11. № 4. P. 2141005. https://doi.org/10.1142/S1793984421410051
  12. Li Z., Jiang Z., Zhao L. et al. // Mater. Sci. Eng. C. 2017. V. 81. P. 443. https://doi.org/10.1016/j.msec.2017.08.019
  13. van de Vitte P., Esselbrugge H., Dijkstra P.J. et al. // J. Membr. Sci. 1996. V. 113. № 2. P. 223. https://doi.org/10.1016/0376-7388(95)00068-2
  14. Sawalha H., Schroen K., Boom R. // J. Appl. Polym. Sci. 2007. V. 104. P. 959. https://doi.org/10.1002/app.25808
  15. Mitrinovic D.M., Tikhonov A.M., Li M. et al. // Phys. Rev. Lett. 2000. V. 85. P. 582. https://doi.org/10.1103/PhysRevLett.85.582
  16. Tikhonov A.M., Schlossman M.L. // J. Phys. Chem. B. 2003. V. 107. P. 3344. https://doi.org/10.1021/jp0271817
  17. Mironov A.V., Mironova O.A., Syachina M.A., Popov V.K. // Polymer. 2019. V. 182. № 2. P. 121845. https://doi.org/10.1016/j.polymer.2019.121845
  18. Ramos T., Moroni L. // Tissue Eng. Pt C: Methods. V. 26. № 2. P. 91. https://doi.org/10.1089/ten.tec.2019.0344
  19. Hoshi K., Fujihara Y., Yamawaki T. et al. // Histochem. Cell. Biol. 2018. V. 149. P. 375. https://doi.org/10.1007/s00418-018-1652-2
  20. Aubert-Pouëssel A., Venier-Julienne M.C., Saulnier P. et al. // Pharm. Res. 2005. V. 21. № 12. P. 2384. https://doi.org/10.1007/s11095-004-7693-3
  21. Hamley I.W., Pedersen J.S. // J. Appl. Cryst. 1994. V. 27. P. 29. https://doi.org/10.1107/S0021889893006260
  22. Tolan M. X-Ray Scattering from Soft-Matter Thin Films / V. 148 of Springer Tracts in Modern Physics. Berlin: Springer-Verlag, 1999. 197 p. https://doi.org/10.1007/BFb0112834
  23. Kozhevnikov I.V. // Nucl. Instrum. Methods Phys. Res. A. 2003. V. 508. P. 519. https://doi.org/10.1016/S0168-9002(03)01512-2
  24. Тихонов А.М., Асадчиков В.Е., Волков Ю.О. и др. // Приборы и техника эксперимента. 2021. № 1. С. 146. https://doi.org/10.31857/S0032816221010158
  25. Асадчиков В.Е., Бабак В.Г., Бузмаков А.В. и др. // Приборы и техника эксперимента. 2005. № 3. С. 99. https://doi.org/10.1007/s10786-005-0064-4
  26. Асадчиков В.Е., Волков Ю.О., Рощин Б.С. и др. // Радиоэлектроника. Наносистемы. Информационные технологии. 2020. Т. 12. № 1. С. 145. https://doi.org/10.17725/rensit.2020.12.145
  27. Kozhevnikov I.V., Peverini L., Ziegler E. // Phys. Rev. B. 2012. V. 85. P. 125439. https://doi.org/10.1103/PhysRevB.85.125439
  28. Braslau A., Pershan P.S., Swislow J. et al. // Phys. Rev. A. 1988. V. 38. № 5. P. 2457. https://doi.org/10.1103/PhysRevA.38.2457

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
2.

Жүктеу (717KB)
3.

Жүктеу (166KB)
4.

Жүктеу (380KB)
5.

Жүктеу (192KB)

© Russian Academy of Sciences, 2023