作者的详细信息
Бжихатлов, К. Ч.
| 期 | 栏目 | 标题 | 文件 |
| 编号 4 (2025) | Articles | Size dependence of linear tension at a curved two-dimensional phase boundary |
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X-ray diffraction
X-ray photoelectron spectroscopy
deformation
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface modification
surface morphology
synchrotron radiation
thin films
zinc oxide
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编号 3 (2025)
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关键字
X-ray diffraction
X-ray photoelectron spectroscopy
deformation
electron microscopy
electronic structure
ion implantation
irradiation
magnetron sputtering
microstructure
nanoparticles
neutron reflectometry
phase composition
scanning electron microscopy
silicon
structure
surface
surface modification
surface morphology
synchrotron radiation
thin films
zinc oxide
最新一期