Peculiarities of formation of defects initiating fatigue faults in granular alloy EP741NP

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The samples of EP741NP alloy destroyed during fatigue testing were investigated by means of transmission electron microscopy, energy-dispersive X-ray microanalysis and electron diffraction. The composition and crystal structure of defects detected at the boundaries of fatigue cracks were studied in details. It was shown that such defects mainly have the morphology of elongated flat "carpets" containing NiO, CTixNb1–x, amorphous AlOx, HfO2, Al2O3, β-Al2O3, Al2MgO4, Co7Mo6, Co3O4, S4Ti3, NbO2, TiO2, as well as amorphous regions containing C, O, Ca, S, Na and Cl. Assumptions were made about the source and of time formation of the studied defects.

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作者简介

I. Pavlov

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC National Research Centre “Kurchatov Institute”

编辑信件的主要联系方式.
Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow

M. Artamonov

Lyulka Design Bureau

Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow

V. Artemov

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC National Research Centre “Kurchatov Institute”

Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow

A. Kumskov

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC National Research Centre “Kurchatov Institute”

Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow

E. Marchukov

Lyulka Design Bureau

Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow

A. Vasiliev

Shubnikov Institute of Crystallography of Kurchatov Complex of Crystallography and Photonics of NRC National Research Centre “Kurchatov Institute”; Moscow Institute of Physics and Technology (National Research University) Moscow region

Email: a.vasiliev56@gmail.com
俄罗斯联邦, Moscow; Dolgoprudny

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2. Fig. 1. Bright-field TEM images of the EP741NP nickel alloy and electron diffraction patterns from sample regions (a, b), fracture boundaries are indicated by white arrows, a – dotted lines indicate an example of the γ´-phase, gray arrows indicate a cluster consisting of crystalline and amorphous precipitates, b – gray arrow indicates the precipitate CTixNb1–x. Electron diffraction pattern obtained from the γ- and γ´-phases (c), electron diffraction pattern obtained from CTixNb1–x (d).

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3. Fig. 2. Dark-field STEM image of a defect (a), element distribution maps constructed using the ERM method (b-I–b-XIII).

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4. Fig. 3. HRTEM image of the boundary between the cluster and the nickel alloy (a). Two-dimensional Fourier spectra of the areas marked with numbers 1 (b), 2 (c), 3 (d).

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5. Fig. 4. Dark-field STEM image of a HfO2 particle with Al2O3 inclusions shown by arrows (a); corresponding electron diffraction patterns: b – HfO2, c – α-Al2O3.

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6. Fig. 5. HR TEM images of β-aluminum oxide (region 1) and spinel (region 2) (a); the corresponding Fourier spectra (b, c).

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7. Fig. 6. HRTEM images of Co7Mo6 (a) and Co3O4 (b). The insets show the corresponding electron diffraction pattern and Fourier spectrum.

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8. Fig. 7. Dark-field STEM image (a) and element distribution maps constructed by the EDX method (b-I–b-V). Electron diffraction patterns corresponding to S4Ti3 (c), NbO2 (d), and TiO2 (d).

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9. Fig. 8. Dark-field STEM image (a) and element distribution maps constructed by the ERM method (b-I–b-V).

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